35.240.30: IT applications in information, documentation and publishing
Search Results
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IEEE/IEC 61671-2012
IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
standard by IEEE/IEC, 07/16/2012.
Languages: English
Historical Editions: IEEE 1671-2010, IEEE 1671-2006
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IEEE/IEC 61671-5-2016
IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description
standard by IEEE/IEC, 04/08/2016.
Languages: English
- MULTI-USER
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IEEE/IEC 61671-2-2016
IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description
standard by IEEE/IEC, 04/08/2016.
Languages: English
- MULTI-USER
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IEEE/IEC 61671-4-2016
IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration
standard by IEEE/IEC, 04/08/2016.
Languages: English
- MULTI-USER
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IEEE/IEC 61671-6-2016
IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description
standard by IEEE/IEC, 04/08/2016.
Languages: English
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MOST RECENT
IEEE 1599-2008
IEEE Recommended Practice for Defining a Commonly Acceptable Musical Application Using XML
standard by IEEE, 09/26/2008.
Languages: English
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MOST RECENT
IEEE 1871.2-2017
IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment
standard by IEEE, 03/14/2018.
Languages: English
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MOST RECENT
IEEE 1871.1-2014
IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters
standard by IEEE, 02/10/2015.
Languages: English
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HISTORICAL
IEEE 1671-2010
This document has been replaced. View the most recent version.
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
standard by IEEE, 01/20/2011.
Languages: English
Historical Editions: IEEE/IEC 61671-2012, IEEE 1671-2006
- MULTI-USER
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HISTORICAL
IEEE 1671-2006
This document has been replaced. View the most recent version.
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
standard by IEEE, 12/15/2006.
Languages: English
Historical Editions: IEEE/IEC 61671-2012, IEEE 1671-2010
- MULTI-USER
