Computer Hardware/Design and Test
Search Results
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IEEE/IEC 62265-2005
IEC/IEEE International Standard - Advanced Library Format (ALF) Describing Integrated Circuit (IC) Technology, Cells, and Blocks
standard by IEEE/IEC, 02/20/2004.
Languages: English
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IEEE/IEC 62142-2005
IEC/IEEE International Standard - Verilog(R) Register Transfer Level Synthesis
standard by IEEE/IEC, 12/18/2005.
Languages: English
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MOST RECENT
IEEE 1226.6-1996 [ Withdrawn ]
IEEE ABBET(R)- IEEE Guide for the Understanding of the "A Broad-Based Environment for Test (ABBET)(R)" Standard
standard by IEEE, 06/26/1996.
Languages: English
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MOST RECENT
IEEE 1546-2000
IEEE Guide for Digital Test Interchange Format (DTIF) Application
standard by IEEE, 03/23/2001.
Languages: English
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HISTORICAL
IEEE 896.1-1987
This document has been replaced. View the most recent version.
IEEE Standard Backplane Bus Specifications for Multiprocessor Architectures: Futurebus+(R)
standard by IEEE, 07/28/1988.
Languages: English
Historical Editions: IEEE 896.1-1991
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MOST RECENT
IEEE 166-1977 [ Withdrawn ]
IEEE Standard Definitions of Terms for Hybrid Computer Linkage Components
standard by IEEE, 07/29/1977.
Languages: English
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HISTORICAL
IEEE 1149.4-1999
This document has been replaced. View the most recent version.
IEEE Standard for a Mixed-Signal Test Bus
standard by IEEE, 03/20/2000.
Languages: English
Historical Editions: IEEE 1149.4-2010
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MOST RECENT
IEEE 1603-2003 [ Withdrawn ]
IEEE Standard for an Advanced Library Format (ALF) Describing Integrated Circuit (IC) Technology, Cells, and Blocks
standard by IEEE, 02/20/2004.
Languages: English
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MOST RECENT
IEEE 1194-1991
IEEE Standard for Backplane Electrical Performance
standard by IEEE, 07/31/1991.
Languages: English
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HISTORICAL
IEEE 1149.6-2003
This document has been replaced. View the most recent version.
IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
standard by IEEE, 04/17/2003.
Languages: English
Historical Editions: IEEE 1149.6-2015
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