Test Instrumentation and Techniques

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  1. IEEE/IEC 61671-2012

    IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

    standard by IEEE/IEC, 07/16/2012.

    Languages: English

    Historical Editions: IEEE 1671-2010IEEE 1671-2006

    • 👥MULTI-USER
  2. IEEE/IEC 62526-2007

    IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

    standard by IEEE/IEC, 12/09/2007.

    Languages: English

    • 👥MULTI-USER
  3. IEEE/IEC 62527-2007

    IEC 62527 Ed. 1 (IEEE Std 1450.2(TM)-2002): Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

    standard by IEEE/IEC, 12/09/2007.

    Languages: English

    • 👥MULTI-USER
  4. IEEE/IEC 61671-5-2016

    IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description

    standard by IEEE/IEC, 04/08/2016.

    Languages: English

    • 👥MULTI-USER
  5. IEEE/IEC 60488-2-2004

    IEC/IEEE International - Standard Digital Interface for Programmable Instrumentation - Part 2: Codes, formats, protocols and common commands

    standard by IEEE/IEC, 05/15/2004.

    Languages: English

    • 👥MULTI-USER
  6. IEEE/IEC 61671-2-2016

    IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description

    standard by IEEE/IEC, 04/08/2016.

    Languages: English

    • 👥MULTI-USER
  7. IEEE/IEC 63003-2015

    IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)

    standard by IEEE/IEC, 12/30/2015.

    Languages: English

    • 👥MULTI-USER
  8. IEEE/IEC 61671-4-2016

    IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration

    standard by IEEE/IEC, 04/08/2016.

    Languages: English

    • 👥MULTI-USER
  9. IEEE/IEC 61671-6-2016

    IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description

    standard by IEEE/IEC, 04/08/2016.

    Languages: English

    • 👥MULTI-USER
  10. MOST RECENT

    Std

    IEEE Automatic Test Markup Language (ATML) - IEEE 1671(TM) Series (Bundle)

    standard by IEEE, 05/16/2018.

    Languages: English

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