Electron Devices

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  1. MOST RECENT

    27091

    IEEE 1181-1991

    IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated- Circuit Process Characterization

    standard by IEEE, 12/13/1991.

    Languages: English

    • 👥MULTI-USER
  2. MOST RECENT

    2577078

    IEEE 3111-2024

    IEEE Recommended Practice for Test and Inspection of Laser Devices Used for Remote Removal of Foreign Matter in Public Infrastructure Equipment

    standard by IEEE, 05/21/2024.

    Languages: English

    • 👥MULTI-USER
  3. MOST RECENT

    27258

    IEEE 1043-1996

    IEEE Recommended Practice for Voltage-Endurance Testing of Form-Wound Bars and Coils

    standard by IEEE, 11/30/1997.

    Languages: English

    Historical Editions: IEEE 1043-1989

    • 👥MULTI-USER
  4. HISTORICAL

    1777549

    IEEE 1043-1989

    This document has been replaced. View the most recent version.

    IEEE Recommended Practice for Voltage-Endurance Testing of Form-Wound Bars and Coils

    standard by IEEE, 12/07/1989.

    Languages: English

    Historical Editions: IEEE 1043-1996

    • 👥MULTI-USER
  5. HISTORICAL

    1777666

    IEEE 1005-1991

    This document has been replaced. View the most recent version.

    IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays

    standard by IEEE, 10/17/1991.

    Languages: English

    Historical Editions: IEEE 1005-1998

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  6. MOST RECENT

    1908689

    IEEE 161-1971

    IEEE Standard Definitions on Electron Tubes

    standard by IEEE, 11/30/1970.

    Languages: English

    • 👥MULTI-USER
  7. MOST RECENT

    1777751

    IEEE 581-1978 [ Withdrawn ]

    IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors

    standard by IEEE, 04/28/1978.

    Languages: English

    • 👥MULTI-USER
  8. MOST RECENT

    2179872

    IEEE 2813-2020

    IEEE Standard for Big Data Business Security Risk Assessment

    standard by IEEE, 02/26/2021.

    Languages: English

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  9. HISTORICAL

    1838869

    IEEE 1851-2012

    This document has been replaced. View the most recent version.

    IEEE Standard for Design Criteria of Integrated Sensor-Based Test Applications for Household Appliances

    standard by IEEE, 08/15/2012.

    Languages: English

    Historical Editions: IEEE 1851-2023

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  10. MOST RECENT

    Std

    IEEE 2861.4-2023

    IEEE Standard for Game Voice Enhancement of Mobile Gaming

    standard by IEEE, 09/29/2023.

    Languages: English

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