31.220.10: Plug-and-socket devices
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IEEE/IEC 63004-2015
IEC/IEEE International standard for receiver fixture interface
standard by IEEE/IEC, 12/30/2015.
Languages: English
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IEEE/IEC 63003-2015
IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
standard by IEEE/IEC, 12/30/2015.
Languages: English
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MOST RECENT
IEEE 287.2-2021
IEEE Recommended Practice for Precision Coaxial Connectors at RF, Microwave, and Millimeter-Wave Frequencies--Part 2: Test Procedures
standard by IEEE, 09/16/2022.
Languages: English
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MOST RECENT
IEEE 287.3-2021
IEEE Recommended Practice for Precision Coaxial Connectors at RF, Microwave, and Millimeteter-wave Frequencies-Part 3: Connector Effects, Uncertainty Specifications, and Recommendations for Performance
standard by IEEE, 09/16/2022.
Languages: English
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IEEE 1101.11-1998
IEEE Standard for Mechanical Rear Plug-in Units Specifications for Microcomputers Using IEEE 1101.1 and IEEE 1101.10 Equipment Practice
standard by IEEE, 06/30/1998.
Languages: English
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MOST RECENT
IEEE 287.1-2021
IEEE Standard for Precision Coaxial Connectors at RF, Microwave, and Millimeter-Wave Frequencies--Part 1: General Requirements, Definitions, and Detailed Specifications
standard by IEEE, 09/16/2022.
Languages: English
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HISTORICAL
IEEE 1505-2006
This document has been replaced. View the most recent version.
IEEE Standard for Receiver Fixture Interface
standard by IEEE, 04/16/2007.
Languages: English
Historical Editions: IEEE 1505-2010
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IEEE 1505-2010
IEEE Standard for Receiver Fixture Interface
standard by IEEE, 11/15/2010.
Languages: English
Historical Editions: IEEE 1505-2006
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HISTORICAL
IEEE 1505.1-2008
This document has been replaced. View the most recent version.
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
standard by IEEE, 08/01/2013.
Languages: English
Historical Editions: IEEE 1505.1-2019
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IEEE 1505.1-2019
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
standard by IEEE, 08/20/2019.
Languages: English
Historical Editions: IEEE 1505.1-2008
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