1775269

JEDEC JESD 24-4 (R2002)

ADDENDUM No. 4 to JESD24 - THERMAL IMPEDANCE MEASUREMENTS FOR BIPOLAR TRANSISTORS (DELTA BASE-EMITTER VOLTAGE METHOD)

Amendment by JEDEC Solid State Technology Association , 11/01/1990

This document is an amendment. View the base document.

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The purpose of this test method is to measure the thermal impedance of the Bipolar Transistor under the specified conditions of applied voltage, current and pulse duration. The temperature sensitivity of the base-emitter voltage is used as the junction temperature indicator. This test method is used to measure the thermal response of the junction to a heating pulse. Specifically, the test may be used to measure dc thermal resistance, and to ensure proper die mountdown to its case. This is accomplished through the appropriate choice of pulse duration and heating power magnitude.
 

Product Details

Published:
11/01/1990
Number of Pages:
16
File Size:
1 file , 350 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus