1762524

JEDEC JEP138

USER GUIDELINES FOR IR THERMAL IMAGING DETERMINATION OF DIE TEMPERATURE

standard by JEDEC Solid State Technology Association , 09/01/1999

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Full Description

The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as thermal resistance.
 

Product Details

Published:
09/01/1999
Number of Pages:
11
File Size:
1 file , 54 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus