Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $54.00
    • Add to Cart
    • Printed Edition + PDF
    • Immediate download
    • $73.00
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

A revised method for determining the effects of bias conditions and temperature, over time, on solid state devices is now available. Revision B of A108 includes low temperature operating life (LTOL) and high temperature gate bias (HTGB) stress conditions, revised cool down requirements for high temperature stress, and a procedure to follow if parts are not tested within the allowed time window.
 

Document History

  1. JEDEC JESD22-A108F


    TEMPERATURE, BIAS, AND OPERATING LIFE

    • Most Recent
  2. JEDEC JESD22-A108E


    TEMPERATURE, BIAS, AND OPERATING LIFE

    • Historical Version
  3. JEDEC JESD22-A108D


    TEMPERATURE, BIAS, AND OPERATING LIFE

    • Historical Version
  4. JEDEC JESD 22-A108C

    👀currently
    viewing


    TEMPERATURE, BIAS, AND OPERATING LIFE

    • Historical Version