Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $54.00
    • Add to Cart
    • Printed Edition + PDF
    • Immediate download
    • $73.00
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices? operating condition in an accelerated way, and is primarily for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as burn-in, may be used to screen for infant mortality related failures. The detailed use and application of burn-in is outside the scope of this document.
 

Document History

  1. JEDEC JESD22-A108F

    👀currently
    viewing


    TEMPERATURE, BIAS, AND OPERATING LIFE

    • Most Recent
  2. JEDEC JESD22-A108E


    TEMPERATURE, BIAS, AND OPERATING LIFE

    • Historical Version
  3. JEDEC JESD22-A108D


    TEMPERATURE, BIAS, AND OPERATING LIFE

    • Historical Version
  4. JEDEC JESD 22-A108C


    TEMPERATURE, BIAS, AND OPERATING LIFE

    • Historical Version