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JEDEC JEP118

GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING

standard by JEDEC Solid State Technology Association , 12/01/2018

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These guidelines apply to GaAs Monolithic Microwave Integrated Circuits (MMICs) and their individual component building blocks, such as GaAs Metal-Semiconductor Field Effect Transistors (MESFETs), Pseudomorphic High Electron Mobility Transistors (PHEMTs), Heterojunction Bipolar Transistors (HBTs), resistors, and capacitors. While the procedure described in this document may be applied to other semiconductor technologies, especially those used in RF and microwave frequency analog applications, it is primarily intended for technologies based on GaAs and related III-V material systems (InP, AlGaAs, InGaAs, InGaP, GaN, etc).
 

Product Details

Published:
12/01/2018
Number of Pages:
28
File Size:
1 file , 420 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus
 

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