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JEDEC JEP118

GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING

standard by JEDEC Solid State Technology Association , 01/01/1993

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These guidelines apply to monolithic microwave GaAs integrated circuits (MMICs) and their individual component building blocks, such as GaAs field effect transistors (FETs), resistors, and capacitors. The purpose of this document is to define a standard approach for evaluating the expected live of GaAs MMICs so that results from different life tests can be compared and so that wording of this document that the MMIC contains at least one FET, but the use of this document has no such limitation.
 

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Published:
01/01/1993
Number of Pages:
20
File Size:
1 file , 570 KB
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This product is unavailable in Russia, Ukraine, Belarus
 

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