1653819

BS ISO 24173:2009

Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

standard by British Standard / International Organization for Standardization , 10/31/2009

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Cross References:
ISO/IEC 17025
ISO/IEC Guide 98-3
GUM:1995
ASTM E 3
ASTM E 1558


All current amendments available at time of purchase are included with the purchase of this document.
 

Product Details

Published:
10/31/2009
ISBN(s):
9780580553974
Number of Pages:
54
File Size:
1 file , 11 MB
Same As:
ISO 24173:2009, ISO 24173:2009
Product Code(s):
30133937, 30133937, 30133937
Note:
This product is unavailable in Russia, Ukraine, Belarus
 

Document History

  1. BS ISO 24173:2024


    Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

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  2. BS ISO 24173:2009

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    Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

    • Historical Version

  3. BS 08/30133935 DC


    ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

    • Historical Version