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ISO 24173:2009

Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction

standard by International Organization for Standardization , 09/01/2009

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Full Description

ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

 

Product Details

Published:
09/01/2009
File Size:
1 file , 9.4 MB
Same As:
BS ISO 24173:2009, BS ISO 24173:2009
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This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. ISO 24173:2024


    Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction

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  2. ISO 24173:2009

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    Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction

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