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All current amendments available at time of purchase are included with the purchase of this document.
 

Document History

  1. BS ISO 24173:2024

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    Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

    • Most Recent
  2. BS ISO 24173:2009


    Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

    • Historical Version
  3. BS 08/30133935 DC


    ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

    • Historical Version