JC-25: Transistors

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  1. MOST RECENT

    1762523

    JEDEC JEP115 (R1999)▹

    POWER MOSFET ELECTRICAL DOSE RATE TEST METHOD

    standard by JEDEC Solid State Technology Association, 08/01/1989.

    Languages: English

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  2. MOST RECENT

    1762524

    JEDEC JEP138▹

    USER GUIDELINES FOR IR THERMAL IMAGING DETERMINATION OF DIE TEMPERATURE

    standard by JEDEC Solid State Technology Association, 09/01/1999.

    Languages: English

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  3. MOST RECENT

    1762525

    JEDEC JEP145▹

    GUIDELINE FOR ASSESSING THE CURRENT-CARRYING CAPABILITY OF THE LEADS IN A POWER PACKAGE SYSTEM

    standard by JEDEC Solid State Technology Association, 02/01/2003.

    Languages: English

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  4. MOST RECENT

    1762526

    JEDEC JEP65 (R1999)▹

    TEST PROCEDURES FOR VERIFICATION OF MAXIMUM RATINGS OF POWER TRANSISTORS

    standard by JEDEC Solid State Technology Association, 12/01/1967.

    Languages: English

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  5. MOST RECENT

    1762527

    JEDEC JEP69-B (R1999)▹

    PREFERRED LEAD CONFIGURATION FOR FIELD-EFFECT TRANSISTORS

    standard by JEDEC Solid State Technology Association, 11/01/1973.

    Languages: English

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  6. MOST RECENT

    1762528

    JEDEC JEP84A▹

    RECOMMENDED PRACTICE FOR MEASUREMENT OF TRANSISTOR LEAD TEMPERATURE

    standard by JEDEC Solid State Technology Association, 06/01/2004.

    Languages: English

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  7. MOST RECENT

    1772387

    JEDEC JESD10 (R2002)▹

    LOW FREQUENCY POWER TRANSISTORS

    standard by JEDEC Solid State Technology Association, 01/01/1976.

    Languages: English

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  8. MOST RECENT

    1772388

    JEDEC JESD 24▹

    POWER MOSFETS

    standard by JEDEC Solid State Technology Association, 07/01/1985.

    Languages: English

    Amendments, rulings, and supplements: JEDEC JESD24-12, JEDEC JESD 24-6 (R2002), JEDEC JESD 24-11 (R2002), JEDEC JESD 24-10 (R2002), JEDEC JESD 24-8 (R2002), JEDEC JESD 24-9 (R2002), JEDEC JESD 24-2 (R2002), JEDEC JESD 24-4 (R2002), JEDEC JESD 24-3, JEDEC JESD 24-5 (R2002), JEDEC JESD 24-1 (R2002), JEDEC JESD 24-7 (R2002)

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  9. MOST RECENT

    1909887

    JEDEC JESD241▹

    Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities

    standard by JEDEC Solid State Technology Association, 12/01/2015.

    Languages: English

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  10. MOST RECENT

    1772390

    JEDEC JESD 24-10 (R2002)▹

    ADDENDUM No. 10 to JESD24 - TEST METHOD FOR MEASUREMENT OF REVERSE RECOVERY TIME trr FOR POWER MOSFET DRAIN-SOURCE DIODES

    Amendment by JEDEC Solid State Technology Association, 08/01/1994.

    Languages: English

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