31.200: Integrated circuits. Microelectronics
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MOST RECENT
IEEE 1149.10-2017
IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
standard by IEEE, 07/28/2017.
Languages: English
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HISTORICAL
IEEE 1149.1-2001
This document has been replaced. View the most recent version.
IEEE Standard Test Access Port and Boundary Scan Architecture
standard by IEEE, 07/23/2001.
Languages: English
Historical Editions: IEEE 1149.1-2013, IEEE 1149.1-1990
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MOST RECENT
IEEE 1149.1-2013
IEEE Standard for Test Access Port and Boundary-Scan Architecture
standard by IEEE, 05/13/2013.
Languages: English
Historical Editions: IEEE 1149.1-2001, IEEE 1149.1-1990
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MOST RECENT
IEEE 1181-1991
IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated- Circuit Process Characterization
standard by IEEE, 12/13/1991.
Languages: English
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HISTORICAL
IEEE 1241-2000
This document has been replaced. View the most recent version.
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
standard by IEEE, 06/22/2001.
Languages: English
Historical Editions: IEEE 1241-2023, IEEE 1241-2010
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HISTORICAL
IEEE 1241-2010
This document has been replaced. View the most recent version.
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
standard by IEEE, 01/14/2011.
Languages: English
Historical Editions: IEEE 1241-2023, IEEE 1241-2000
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MOST RECENT
IEEE 1241-2023
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
standard by IEEE, 10/06/2023.
Languages: English
Historical Editions: IEEE 1241-2010, IEEE 1241-2000
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HISTORICAL
IEEE 1481-2009
This document has been replaced. View the most recent version.
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
standard by IEEE, 03/11/2010.
Languages: English
Historical Editions: IEEE 1481-2019, IEEE 1481-1999
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MOST RECENT
IEEE 1481-2019
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
standard by IEEE, 03/13/2020.
Languages: English
Historical Editions: IEEE 1481-2009, IEEE 1481-1999
- Redlines
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HISTORICAL
IEEE 1500-2005
This document has been replaced. View the most recent version.
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
standard by IEEE, 08/29/2005.
Languages: English
Historical Editions: IEEE 1500-2022
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