General/Other-IMT
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HISTORICAL
IEEE 1057-2007
This document has been replaced. View the most recent version.
IEEE Standard for Digitizing Waveform Recorders
standard by IEEE, 04/18/2008.
Languages: English
Historical Editions: IEEE 1057-2017, IEEE 1057-1994, IEEE 1057-1989
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MOST RECENT
IEEE 1139-1988 [ Withdrawn ]
IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology
standard by IEEE, 04/28/1989.
Languages: English
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HISTORICAL
IEEE 1139-1999
This document has been replaced. View the most recent version.
Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology - Random Instabilities
standard by IEEE, 01/01/1999.
Languages: English
Historical Editions: IEEE 1139-2022, IEEE 1139-2008, IEEE 1139-1999
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HISTORICAL
IEEE 1139-2008
This document has been replaced. View the most recent version.
IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities
standard by IEEE, 02/27/2009.
Languages: English
Historical Editions: IEEE 1139-2022, IEEE 1139-1999, IEEE 1139-1999
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MOST RECENT
IEEE 1174-2000
IEEE Standard Serial Interface for Programmable Instrumentation
standard by IEEE, 02/14/2001.
Languages: English
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HISTORICAL
IEEE 1193-1994
This document has been replaced. View the most recent version.
IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency Generators
standard by IEEE, 02/27/1995.
Languages: English
Historical Editions: IEEE 1193-2022, IEEE 1193-2003
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HISTORICAL
IEEE 1193-2003
This document has been replaced. View the most recent version.
IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency Generators
standard by IEEE, 03/12/2004.
Languages: English
Historical Editions: IEEE 1193-2022, IEEE 1193-1994
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HISTORICAL
IEEE 1241-2000
This document has been replaced. View the most recent version.
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
standard by IEEE, 06/22/2001.
Languages: English
Historical Editions: IEEE 1241-2023, IEEE 1241-2010
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HISTORICAL
IEEE 1241-2010
This document has been replaced. View the most recent version.
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
standard by IEEE, 01/14/2011.
Languages: English
Historical Editions: IEEE 1241-2023, IEEE 1241-2000
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MOST RECENT
IEEE 1413-2010
IEEE Standard Framework for Reliability Prediction of Hardware
standard by IEEE, 04/09/2010.
Languages: English
Historical Editions: IEEE 1413-1998
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