31.080.01: Semiconductor devices in general

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  1. MOST RECENT

    1930609

    IEEE 1804-2017

    IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules

    standard by IEEE, 01/31/2018.

    Languages: English

    • 👥MULTI-USER
  2. MOST RECENT

    1777943

    IEEE 216-1960 [ Withdrawn ]

    IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms

    standard by IEEE, 10/31/1960.

    Languages: English

    • 👥MULTI-USER
  3. MOST RECENT

    1777656

    IEEE 255-1963 [ Withdrawn ]

    IEEE Standard Letter Symbols for Semiconductor Devices

    standard by IEEE, 12/01/1963.

    Languages: English

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  4. MOST RECENT

    1777551

    IEEE 641-1987 [ Withdrawn ]

    IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays

    standard by IEEE, 10/07/1988.

    Languages: English

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  5. IEEE/ANSI N42.31-2003

    American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation

    standard by IEEE/ANSI, 08/20/2003.

    Languages: English

    • 👥MULTI-USER