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About This Item

 

Full Description

This document describes the test methodology for measuring group delay and group delay variation of devices used in an HFC network.
 

Document History

  1. SCTE 45 2022


    Test Method for Group Delay

    • Most Recent
  2. SCTE 45 2017

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    Test Method for Group Delay

    • Historical Version
  3. SCTE 45 2012


    Test Method for Group Delay

    • Historical Version
  4. SCTE 45 2007


    Test Method for Group Delay

    • Historical Version
  5. SCTE 45 2002


    Test Method for Group Delay, (formerly IPS TP 211)

    • Historical Version