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About This Item

 

Full Description

The purpose of this test is to measure the group delay and group delay variation of a properly terminated device. This procedure is applicable to testing of 75 components.
 

Document History

  1. SCTE 45 2022


    Test Method for Group Delay

    • Most Recent
  2. SCTE 45 2017


    Test Method for Group Delay

    • Historical Version
  3. SCTE 45 2012


    Test Method for Group Delay

    • Historical Version
  4. SCTE 45 2007

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    Test Method for Group Delay

    • Historical Version
  5. SCTE 45 2002


    Test Method for Group Delay, (formerly IPS TP 211)

    • Historical Version