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JEDEC JEP195

Guideline for Evaluating Gate Switching Instability of Silicon Carbide Metal-Oxide-Semiconductor Devices for Power Electronic Conversion

standard by JEDEC Solid State Technology Association , 02/01/2023

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Full Description

This document elaborates on the information given in JEP184 regarding the long-time stability of device parameters under static conditions and under application near switching conditions.

 

Product Details

Published:
02/01/2023
Number of Pages:
22
File Size:
1 file , 570 KB
Note:
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