Std

JEDEC JEB 15

TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS

standard by JEDEC Solid State Technology Association , 11/01/1969

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Full Description

This bulletin explains the terminology and methods of measurement for bistable semiconductor microcircuits. It is also intended to be used with the EIA Registration Data Format for semiconductor integrated bistable logic circuits.
 

Product Details

Published:
11/01/1969
Number of Pages:
97
File Size:
1 file
Note:
This product is unavailable in Russia, Ukraine, Belarus