1248203

ISO 18452:2005

Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer

standard by International Organization for Standardization , 11/15/2005

View all product details

Most Recent

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $81.00
    • Add to Cart
    • Printed Edition + PDF
    • Immediate download
    • $134.00
    • Add to Cart

Customers Who Bought This Also Bought

Identical Versions Available

 

About This Item

 

Full Description

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
 

Product Details

Published:
11/15/2005
File Size:
1 file , 240 KB
Same As:
DIN EN ISO 18452, BS EN ISO 18452:2016
Note:
This product is unavailable in Ukraine, Russia, Belarus