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About This Item

 

Full Description

BS EN ISO 18452:2016 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of to .

NOTE The method requires a distinct and clearly formed boundary between coated and uncoated parts of the substrate.


Cross References:
ISO 3274


All current amendments available at time of purchase are included with the purchase of this document.
 

Document History

  1. BS EN ISO 18452:2016

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    Fine ceramics (advanced ceramics, advanced technical ceramics). Determination of thickness of ceramic films by contact-probe profilometer

    • Most Recent
  2. BS EN 1071-1:2003


    Advanced technical ceramics. Methods of test for ceramic coatings-Determination of coating thickness by contact probe filometer

    • Historical Version
  3. BS DD ENV 1071-1:1994


    Advanced technical ceramics. Methods of test for ceramic coatings-Determination of coating thickness by contact probe profilometer

    • Historical Version