1744953

IEEE 1671.3-2007

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information

standard by IEEE , 03/28/2008

This document has been replaced. View the most recent version.

View all product details

Historical

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

Scope

The scope of this standard is the definition of an exchange format, using eXtensible Markup Language (XML), for information that uniquely describes a category or type of UUT. The format will include the ability to specify multiple manufacturers for each UUT, as cases may exist where a single UUT is supplied by a variety of manufacturers. This information is intended to support all aspects of the test and maintenance environment.

Purpose

The purpose of this standard is to promote and facilitate interoperability between components of test and maintenance support systems by defining a common set of identification information for UUTs. The UUTDescription schema becomes a class of information that can be used within the ATML family of standards. This standard will allow a common UUT description to be transportable across a variety of test and maintenance environments, including but not limited to, the automotive, semiconductor, aerospace, and military industries.

Abstract

New IEEE Standard - Superseded. This document specifies an exchange format, using XML, for identifying all of the hardware, software, and documentation associated with a unit under test (UUT). This UUT may be tested and diagnosed using a test program set (TPS) on an automatic test system (ATS).
 

Product Details

Published:
03/28/2008
ISBN(s):
9780738153698, 9780738192376
Number of Pages:
33
File Size:
1 file , 2.5 MB
Product Code(s):
STDSU98735
Note:
This product is unavailable in Russia, Belarus
 

Document History

  1. IEEE 1671.3-2017


    IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description

    • Most Recent

  2. IEEE 1671.3-2007

    👀 currently
    viewing


    IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information

    • Historical Version