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IEEE 1671.3-2017

IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description

standard by IEEE , 04/13/2018

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Full Description

Scope

This standard defines an exchange format, utilizing Extensible Markup Language (XML), for both the static description of a UUT and the specific description of UUT instance information.

Purpose

No purpose statement is required since this standard is intended for IEC standardization.

Abstract

Revision Standard - Active. An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard.
 

Product Details

Published:
04/13/2018
ISBN(s):
9781504445672, 9781504445689, 9781504448505
Number of Pages:
93
File Size:
1 file , 3.3 MB
Product Code(s):
STD22925, STDPD22925, STDPL22925
Note:
This product is unavailable in Russia, Ukraine, Belarus
 

Document History

  1. IEEE 1671.3-2017

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    IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description

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  2. IEEE 1671.3-2007


    IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information

    • Historical Version