1030561

IEC 61967-6 Ed. 1.0 b:2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

standard by International Electrotechnical Commission , 06/25/2002

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About This Item

 

Full Description

Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz.
 

Product Details

Edition:
1.0
Published:
06/25/2002
Number of Pages:
51
File Size:
1 file , 750 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus, Canada
 

Amendments, rulings, supplements, and errata

  1. IEC 61967-6 Ed. 1.0 b COR.1:2010

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    Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

  2. IEC 61967-6 Amd.1 Ed. 1.0 b:2008


    Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method