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IEC/TS 61945 Ed. 1.0 b:2000

Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

standard by International Electrotechnical Commission - Technical Standard , 03/10/2000

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Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.
 

Product Details

Edition:
1.0
Published:
03/10/2000
Number of Pages:
23
File Size:
1 file , 120 KB
Note:
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