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IEC 60749-1 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

standard by International Electrotechnical Commission , 08/30/2002

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Amendments, rulings, supplements, and errata

Full Description

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

Product Details

Edition:: 1.0
Published:: 08/30/2002
Number of Pages:: 15
File Size:: 1 file , 390 KB
Note:: This product is unavailable in Ukraine, Russia, Belarus, Canada

Amendments, rulings, supplements, and errata

IEC 60749-1 Ed. 1.0 b COR. 1:2003

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August 2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General