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IEC 60747-11 Ed. 1.0 b:1985 [ Withdrawn ]

Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

standard by International Electrotechnical Commission , 01/01/1985

📝 Amendments Available

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Full Description

Applies to discrete semiconductor devices, excluding optoelectronic devices. Should be read together with the generic specification to which it refers: it gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor devices.
 

Product Details

Edition:
1.0
Published:
01/01/1985
Number of Pages:
35
File Size:
1 file , 1.3 MB
Note:
This product is unavailable in Ukraine, Russia, Belarus, Canada
 

Amendments, rulings, supplements, and errata

  1. IEC 60747-11 Amd.2 Ed. 1.0 b:1996


    Amendment 2 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

  2. IEC 60747-11 Amd.1 Ed. 1.0 b:1991


    Amendment 1 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices