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IEC 60747-5-3 Ed. 1.0 b:1997 [ Withdrawn ]

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

standard by International Electrotechnical Commission , 09/05/1997

📝 Amendments Available

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About This Item

 

Full Description

Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
 

Product Details

Edition:
1.0
Published:
09/05/1997
Number of Pages:
61
File Size:
1 file , 300 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus, Canada
 

Amendments, rulings, supplements, and errata

  1. IEC 60747-5-3 Amd.1 Ed. 1.0 b:2002


    Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods