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  1. MOST RECENT

    1779520

    JEDEC EIA 318-B▹

    MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES

    standard by JEDEC Solid State Technology Association, 07/01/1996.

    Languages: English

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  2. MOST RECENT

    1779517

    JEDEC EIA 323 (R2002)▹

    AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES

    standard by JEDEC Solid State Technology Association, 03/01/1966.

    Languages: English

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  3. MOST RECENT

    1779521

    JEDEC EIA 365 (R1984)▹

    PERFORMANCE TEST PROCEDURE FOR SOLAR CELLS AND CALIBRATION PROCEDURE FOR SOLAR CELL STANDARDS FOR SPACE VEHICLE SERVICE

    standard by JEDEC Solid State Technology Association, 11/01/1969.

    Languages: English

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  4. MOST RECENT

    1779518

    JEDEC EIA 397▹

    RECOMMENDED STANDARD FOR THYRISTORS

    standard by JEDEC Solid State Technology Association, 06/01/1972.

    Languages: English

    Amendments, rulings, and supplements: JEDEC EIA 397-1

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  5. MOST RECENT

    Std

    JEDEC EIA 397-1▹

    ADDENDUM No. 1 TO EIA-397

    Amendment by JEDEC Solid State Technology Association, 07/01/1980.

    Languages: English

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  6. HISTORICAL

    1779515

    JEDEC EIA 557B▹

    This document has been replaced. View the most recent version.

    STATISTICAL PROCESS CONTROL SYSTEMS

    standard by JEDEC Solid State Technology Association, 02/01/2006.

    Languages: English

    Historical Editions: JEDEC JESD557C

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  7. HISTORICAL

    1779516

    JEDEC EIA 670▹

    This document has been replaced. View the most recent version.

    QUALITY SYSTEM ASSESSMENT (SUPERSEDES JESD39-A)

    standard by JEDEC Solid State Technology Association, 06/01/1997.

    Languages: English

    Historical Editions: JEDEC JESD670A

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  8. MOST RECENT

    2522828

    JEDEC /ESDA JS-002-2022▹

    For Electrostatic Discharge Sensitivity Testing Charged Device Model (CDM) Device Level

    standard by JEDEC Solid State Technology Association, 01/05/2023.

    Languages: English

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  9. MOST RECENT

    2522578

    JEDEC /ESDA JTR002-01-22▹

    Charged Device Model Testing of Integrated Circuits

    standard by JEDEC Solid State Technology Association, 01/01/2023.

    Languages: English

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  10. MOST RECENT

    Std

    JEDEC JEB 15▹

    TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS

    standard by JEDEC Solid State Technology Association, 11/01/1969.

    Languages: English

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