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About This Item

 

Full Description

Establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use w/in Military & Aerospace electronic systems incl. basic environmental tests to determine resistance to deleterious effects of natural elements.
 

Document History

  1. MIL MIL-STD-883L


    MICROCIRCUITS

    • Most Recent
  2. MIL MIL-STD-883K


    MICROCIRCUITS

    • Historical Version
  3. MIL MIL-STD-883J


    MICROCIRCUITS

    • Historical Version
  4. MIL MIL-STD-883G


    MICROCIRCUITS(SUPERSEDING MIL-STD-883F)

    • Historical Version
  5. MIL MIL-STD-883F


    MICROCIRCUITS (SUPERSEDING MIL-STD-883E)(S/S BY MIL-STD-883G)

    • Historical Version
  6. MIL MIL-STD-883E

    👀 currently
    viewing


    TEST METHOD STANDARD MICROCIRCUITS (SUPERSEDING MIL-STD-883D) (S/S BY MIL-STD-883F)

    • Historical Version
 

Amendments, rulings, supplements, and errata

  1. MIL MIL-STD-883E Change Notice 5


    TEST METHOD STANDARD MICROCIRCUITS (SUPERSEDING MIL-STD-883D) (S/S BY MIL-STD-883F)

  2. MIL MIL-STD-883E Change Notice 4


    TEST METHOD STANDARD MICROCIRCUITS (SUPERSEDING MIL-STD-883D) (S/S BY MIL-STD-883F)

  3. MIL MIL-STD-883E Change Notice 3


    TEST METHOD STANDARD MICROCIRCUITS (SUPERSEDING MIL-STD-883D) (S/S BY MIL-STD-883F)

  4. MIL MIL-STD-883E Change Notice 1


    TEST METHOD STANDARD MICROCIRCUITS (SUPERSEDING MIL-STD-883D) (S/S BY MIL-STD-883F)

  5. MIL MIL-STD-883E Change Notice 2


    TEST METHOD STANDARD MICROCIRCUITS (SUPERSEDING MIL-STD-883D) (S/S BY MIL-STD-883F)