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JEDEC JESD91B

Method for Developing Acceleration Models for Electronic Device Failure Mechanisms

standard by JEDEC Solid State Technology Association , 03/01/2022

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Full Description

The method described in this document applies to all reliability mechanisms associated with electronic devices.

The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic devices.

 

Product Details

Published:
03/01/2022
Number of Pages:
20
File Size:
1 file , 370 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus
 

Document History

  1. JEDEC JESD91B

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    Method for Developing Acceleration Models for Electronic Device Failure Mechanisms

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  2. JEDEC JESD91-A (R2011)


    METHOD FOR DEVELOPING ACCELERATION MODELS FOR ELECTRONIC COMPONENT FAILURE MECHANISMS

    • Historical Version