1762667

JEDEC JESD51-1

INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)

standard by JEDEC Solid State Technology Association , 12/01/1995

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Full Description

The purpose of this test method is to define a standard Electrical Test Method (ETM) that can be used to determine the thermal characteristics of single integrated circuit devices housed in some form of electrical package. This method will provide a basis for comparison of different devices housed in the same electronic package or similar devices housed in different electronic packages.
 

Product Details

Published:
12/01/1995
Number of Pages:
36
File Size:
1 file , 560 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus