2016005

ISO 17915:2018

Optics and photonics - Measurement method of semiconductor lasers for sensing

standard by International Organization for Standardization , 05/01/2018

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Full Description

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.

This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

 

Product Details

Published:
05/01/2018
File Size:
1 file , 1.1 MB
Same As:
BS ISO 17915:2018
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This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. ISO 17915:2018

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    Optics and photonics - Measurement method of semiconductor lasers for sensing

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  2. ISO/TS 17915:2013


    Optics and photonics - Measurement method of semiconductor lasers for sensing

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