The purpose of this standard is to define methodologies by which high-quality scattering parameters (S-parameters) can be obtained for electrical interconnects that are intended to operate at microwave frequencies (up to 50 GHz). The standard includes requirements for designing test fixtures, evaluating measured data, removing test fixture and instrumentation effects, and verifying the quality of the S-parameters. The primary focus of this standard development is measured S-parameters. However, the methodology is applicable to simulated S-parameters as well. Note that this standard defines a set of metrics to be calculated and reported to the recipient of the S-parameter data. In order to comply with this standard, the values of the metrics shall be included in S-parameter data file. However, the determination of pass/fail status of the results is out of the scope of this standard, and is left to the recipient of the data. Although the highest frequency of interest is set at 50 GHz in this document, the methodology is generally applicable to higher frequencies. The methods and techniques contained herein have been validated only to 50 GHz as of this writing.