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IEC/PAS 62162 Ed. 1.0 en:2000

Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components

standard by International Electrotechnical Commission - Publicly Available Standard , 08/22/2000

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Full Description

Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. IEC/PAS 62162 will be re-issued in the form of IEC international standard under reference IEC 60748-20.
 

Product Details

Edition:
1.0
Published:
08/22/2000
Number of Pages:
7
File Size:
1 file , 120 KB
Note:
This product is unavailable in Canada