749356

IEC 61649 Ed. 1.0 b:1997 [ Withdrawn ]

Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

standard by International Electrotechnical Commission , 05/16/1997

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Full Description

Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.
 

Product Details

Edition:
1.0
Published:
05/16/1997
Number of Pages:
31
File Size:
1 file , 150 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus, Canada
 

Document History

  1. IEC 61649 Ed. 2.0 b:2008


    Weibull analysis

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  2. IEC 61649 Ed. 1.0 b:1997

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    Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

    • Historical Version