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IEC 60749-29 Ed. 1.0 b:2003 [ Withdrawn ]

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

standard by International Electrotechnical Commission , 11/04/2003

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Full Description

Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing ""No Trouble Found"" and ""Electrical Overstress"" failures due to latch-up.
 

Product Details

Edition:
1.0
Published:
11/04/2003
Number of Pages:
41
File Size:
1 file , 920 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus, Canada
 

Document History

  1. IEC 60749-29 Ed. 2.0 b:2011


    Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

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  2. IEC 60749-29 Ed. 1.0 b:2003

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    Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

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