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IEC 60749-27 Ed. 2.0 b:2006

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

standard by International Electrotechnical Commission , 07/18/2006

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Full Description

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive
 

Product Details

Edition:
2.0
Published:
07/18/2006
Number of Pages:
25
File Size:
1 file , 530 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus, Canada
 

Document History

  1. IEC 60749-27 Ed. 2.0 b:2006

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    Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

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  2. IEC 60749-27 Ed. 1.0 b:2003


    Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

    • Historical Version
 

Amendments, rulings, supplements, and errata

  1. IEC 60749-27 Amd.1 Ed. 2.0 b:2012


    Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)