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IEC 60749-17 Ed. 1.0 b:2003 [ Withdrawn ]

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

standard by International Electrotechnical Commission , 02/20/2003

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Full Description

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
 

Product Details

Edition:
1.0
Published:
02/20/2003
Number of Pages:
11
File Size:
1 file , 410 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus, Canada
 

Document History

  1. IEC 60749-17 Ed. 2.0 b:2019


    Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

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    Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

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