This paper is based on findings resulting from ASHRAE Research Project RP-1499.

This paper is the third in a series that investigates the electrostatic discharge (ESD)-related voltages and risks in data centers. This paper analyzes the risk of damage or upset under the following environmental conditions:45%relative humidity (RH), 25% RH, and 8% RH at 27°C, and 8% RH at 38°C. The main purpose of this study is to evaluate the increase of ESDrelated upsets or failures caused by reducing theRHfrom 25% to 8%. The pattern walking test, random walking test, and extrapolation method described by Moradian et al. (2014) are used in this paper. As the distribution function of the tribocharging- induced voltage is not directly known, Chebyshev's inequality is used to predict the upper bound for the probability of ESD-related failures.