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BS ISO 13067:2020

Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

standard by British Standard / International Organization for Standardization , 07/17/2020

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Full Description

This document describes procedures for measuring average grain size derived from a two-dimensional polished cross-section using electron backscatter diffraction (EBSD). This requires the measurement of orientation, misorientation and pattern quality factor as a function of position in the crystalline specimen[1]. The measurements in this document are made on two dimensional sections. The reader should note carefully the definitions used (3.3) which draw a distinction between the measured sectional grain sizes, and the mean grain size which can be derived from them that relates to the three dimensional grain size.

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Product Details

Published:
07/17/2020
ISBN(s):
9780580511011
Number of Pages:
36
File Size:
1 file , 2.3 MB
Product Code(s):
30365237, 30365237, 30365237
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This product is unavailable in Russia, Ukraine, Belarus
 

Document History

  1. BS ISO 13067:2020

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    Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

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  2. BS ISO 13067:2011


    Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

    • Historical Version

  3. BS 10/30195133 DC


    BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

    • Historical Version