2234358 Preview

BS IEC 62899-503-3:2021

Printed electronics-Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method

standard by British Standard / International Electrotechnical Commission , 09/08/2021

View all product details

Most Recent

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Secure PDF 🔒
    • 👥
    • Immediate download
    • $190.50
    • Add to Cart
    • Printed Edition
    • Ships in 1-2 business days
    • $190.50
    • Add to Cart
    • Printed Edition + PDF
    • Immediate download
    • $257.81
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

This part of IEC 62899 specifies a measuring method of contact resistance for printed thin film transistors (TFTs) by the transfer length method (TLM). The method requires the fabrication of a test element group (TEG) with varying channel length (L) between source and drain electrodes. The method is intended for quality assessment of TFT electrode contacts and is suited for determining whether the contact resistance lies within a desired range.

All current amendments available at time of purchase are included with the purchase of this document.

 

Product Details

Published:
09/08/2021
ISBN(s):
9780539043259
Number of Pages:
16
File Size:
1 file , 930 KB
Product Code(s):
30393422, 30393422, 30393422