Resistance measurements are typically compromised by a variety of phenomena, for example serial resistance in the measurement path, self-heating or non-ohmic properties. Whether the effect of such phenomena on a resistance measurement is acceptable or not depends on the magnitude of each effect in comparison to the resistance and to the required accuracy. Hence, the risk of erroneous resistance measurements increases with decreasing resistance and with a tightening of the permissible tolerance.

This document specifies methods of measurement and associated test conditions that eliminate or reduce the influence of adverse phenomena in order to improve the attainable accuracy of low-resistance measurements.

The methods described in this document are applicable for the individual measurements of the resistance of individual resistors, and also for resistance measurements as part of a test sequence. They are applied if prescribed by a relevant component specification, or if agreed between a customer and a manufacturer.

Cross References:
EN 60068-1
IEC 60068-1
EN 60294
IEC 60294
EN 60115-1:2011
IEC 60115-1:2008
EN 60115-1:2011/A11:2015
IEC 61249-5-1
EN 60301
EN 61249-5-1
IEC 60115-8
EN 60115-2
IEC 60115-2
JEITA RCR-2112:1994
EN 60115-8
IEC 60301


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