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About This Item

 

Full Description

BS EN IEC 61967-1:2019 provides general information and definitions on the measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports.

Cross References:
IEC 61967-4
EN 55016-1-1
IEC 61967-5
IEC 61967-2
IEC 61967-6
CISPR 16-1-1
IEC TS 61967-3
IEC 62132-1
IEC 61967-8
EN 62132-1
EN 61967-2
EN 61967-5
IEC 61967-8
IEC 61967-2
IEC 62132-1
EN 61967-8
EN 61967-4
EN 61967-6
IEC 61967-4
IEC 61967-5
IEC 61967-6
CISPR 25:2008
EN 55025:2008
IEC 60050-161:1990


All current amendments available at time of purchase are included with the purchase of this document.
 

Document History

  1. BS EN IEC 61967-1:2019

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    Integrated circuits. Measurement of electromagnetic emissions-General conditions and definitions

    • Most Recent
  2. BS EN 61967-1:2002


    Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-General conditions and definitions

    • Historical Version