Std

BS EN IEC 60749-37:2022

Semiconductor devices. Mechanical and climatic test methods-Board level drop test method using an accelerometer

standard by British-Adopted European Standard , 11/22/2022

View all product details

Most Recent

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Secure PDF 🔒
    • 👥
    • Immediate download
    • $264.16
    • Add to Cart
    • Printed Edition
    • Ships in 1-2 business days
    • $264.16
    • Add to Cart
    • Printed Edition + PDF
    • Immediate download
    • $356.87
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description



All current amendments available at time of purchase are included with the purchase of this document.
 

Product Details

Published:
11/22/2022
ISBN(s):
9780539151992
Number of Pages:
28
File Size:
1 file , 2.5 MB
Product Code(s):
30425837, 30425837, 30425837
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. BS EN IEC 60749-37:2022

    👀 currently
    viewing


    Semiconductor devices. Mechanical and climatic test methods-Board level drop test method using an accelerometer

    • Most Recent

  2. BS EN 60749-37:2008


    Semiconductor devices. Mechanical and climatic test methods-Board level drop test method using an accelerometer

    • Historical Version

  3. BS DD IEC/PAS 62050:2004


    Board level drop test method of components for handheld electronicproduc ts

    • Historical Version