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Full Description

This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the π-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. "Reference Method B", based on the π-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. "Method C", an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.

All current amendments available at time of purchase are included with the purchase of this document.

 

Document History

  1. BS EN IEC 60444-6:2021

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    Measurement of quartz crystal unit parameters-Measurement of drive level dependence (DLD)

    • Most Recent
  2. BS EN 60444-6:2013


    Measurement of quartz crystal unit parameters-Measurement of drive level dependence (DLD)

    • Historical Version
  3. BS EN 60444-6:1997


    Measurement of quartz crystal unit parameters-Measurement of drive level dependence (DLD)

    • Historical Version