BS EN 62496-2:2017 specifies a method of defining the conditions for measurements of optical characteristics of optical circuit boards. The method comprises the use of code reference look-up tables to identify different critical aspects of the measurement environment. The values extracted from the tables are used to construct a measurement identification code, which, in itself, captures sufficient information about the measurement conditions, so as to ensure consistency of independently measured results within an acceptable margin. Recommended measurement conditions are specified to minimise further variation in independently measured results.


Cross References:
IEC 60068-2-64:2008
IEC 61300-3-53:2015 ED1
IEC 60068-2-27:2008
IEC 62496-2-1:2011
ISO 3534-1:2006
IEC 61300-1:2016
IEC 62614:2010
IEC 60068-2-47:1999
IEC TR 62658
IEC TS 62661-2-1
IEC 60825-1
IEC 60793-2
IEC 62496-4-1
IEC 61745:2017
IEC 60793-1-43:2015
IEC 62496-1:2008
IEC 61280-4-1:2009
IEC TR 62349:2014
IEC 62496-2-4:2013


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